ISO INTERNATIONAL STANDARD 19683 First edition 2017-07 Space systems Design qualification and acceptance tests of small spacecraft and units Systemes spatiaux - ( Qualificationde la conception et essaisde réception des petits véhicules spatiaux Reference number ISO 19683:2017(E) @ IS0 2017 copyrighted by UNE, C/ Genova, 6. 28004 Madrid, Spai :T1:58 UTC 2024 Downloaded/printed for Georgia Institute of Technologv. This standard provided bv AENOR. No furthe eproductions authorized IS0 19683:2017(E) COPYRIGHTPROTECTEDDOCUMENT @ IS0 2017, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO's member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 . CP 401 CH-1214 Vernier, Geneva, Switzerland Tel.+4122 749 0111 Fax +41 22 749 09 47 [email protected] www.iso.org ii @ IS0 2017 - All rights reserved @ copyrighted by UNE, C/ Genova, 6. 28004 Madrid, Spain (all rights reserved); Wed Feb 14 07:11:58 UTC 2024 Downloaded/printed for Georgia Institute of Technoloev. This standard provided bv AENOR. No further reproductions authorized. IS0 19683:2017(E) Contents Page Foreword .vii Introduction. .viii 1 Scope .1 2 Normative references .2 3 Terms and definitions .2 4 Abbreviated terms .3 5 General requirements.. 4 5.1 Tailoring 4 5.2 Qualification test. 4 5.3 Acceptance test.. 4 5.4 Proto-flight test. 4 5.5 Retest. 4 5.6 Test documentation 4 5.6.1 Test plan, specification and procedure 5 5.6.2 Test report 5 5.6.3 Datasheet for unit test results. 6 5.7 Test conditions, tolerances and accuracies 6 5.8 Functional test. 6 5.9 Design, verification and testing philosophy 6 6 Satellite system tests. 7 6.1 Test items. 7 6.2 Test level and duration. 8 Unit tests 7 7.1 Test items 8 7.2 Test levels and duration .14 8 Test requirements .17 8.1 Electrical interface. 17 8.1.1 Purpose of test 17 8.1.2 Test facilities and setup as basic requirements 18 8.1.3 Test article configuration. 18 8.1.4 Monitoring during test. 18 8.1.5 Test levels and duration. 18 8.1.6 Test conditions and guidelines 18 8.2 Functional test. 18 8.2.1 Purpose of test 18 8.2.2 Test facilities and setup as basic requirements 18 8.2.3 Test article configuration. 18 8.2.4 Monitoring during test. 18 8.2.5 Test levels and duration.. 18 8.2.6 Test conditions and guidelines 19 8.3 Mission test 19 8.3.1 Purpose of test 19 8.3.2 Test facilities and setup as basic requirements 19 8.3.3 Test article configuration 19 8.3.4 Monitoring during test 19 8.3.5 Test levels and duration.. 19 8.3.6 Test conditions and guidelines 19 8.4 Total Ionization Dose (TID) test. 19 8.4.1 Purpose of test 19 8.4.2 Test facilities and setup as basic requirements 20 8.4.3 Test article configuration. 20 os 20Aightsoesered ii pain (all rights reserved); Wed Feb 14 07:11:58 UTC 2024 Downloaded/printed for Georgia Institute of Technologv. This standard provided bv AENOR. No further reproductions authorized IS0 19683:2017(E) 8.4.4 Monitoring during test. 20 8.4.5 Test levels and duration 20 8.4.6 Test conditions and guidelines 20 8.5 Single Event Effect (SEE) test 20 8.5.1 Purpose of test. 20 8.5.2 Testfacilitiesandsetupasbasicrequirements 20 8.5.3 Test article configuration. 20 8.5.4 Monitoring during test.. 21 8.5.5 Test levels and duration 21 8.5.6 Test conditions and guidelines 21 8.5.7 Test conditions and guidelines 21 8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test 21 8.6.1 Purpose of test. 21 8.6.2 Test facilities and setup as basic requirements. 21 8.6.3 Test article configuration. 22 8.6.4 Monitoring during test 22 8.6.5 Test levels and duration 22 8.6.6 Test conditions and guidelines 22 8.7 Electromagnetic Compatibility (EMC) test 22 8.7.1 Purpose of